网络研讨会
Off the grid: Advanced scanning strategies for modern STEM
March 12, 2026
Copper
Element density: 8.92 g/cm3
Electron configuration: [Ar]3d104s1
Oxidation states: +1,2
X-ray peak intensities
A quick-reference for exploring x-ray peak intensities across element series (K, L, M, N) to support accurate EDS analysis in electron microscopy.
| K-Series | L-Series | M-Series | N-Series | ||||
|---|---|---|---|---|---|---|---|
| Kα | 8.040 | Ll | 0.811 | ||||
| Kβ | 8.903 | Ln | 0.832 | ||||
| Lα1 | 0.930 | ||||||
| Lβ1 | 0.950 | ||||||
Applications
Unlock the power of electron microscopy with Gatan—explore cutting-edge applications, dive into expert-led webinars, and discover insights through detailed application notes that fuel scientific breakthroughs.
网络研讨会
High electron energy loss spectroscopy at extended fine structure
January 29, 2026
应用说明
Electron diffraction for chirality identification in spintronics
August 1, 2024
应用说明
使用 GIF Continuum 内标分析快速获得元素种类和价态面分布
August 1, 2024
应用说明
使用传统扫描电子显微镜 (SEM) 的光谱时间分辨阴极荧光
July 1, 2024
Media Gallery
Immerse yourself in the world of scientific discovery—explore striking microscopy images that reveal the unseen, alongside videos and tutorials showcasing Gatan technology in action.
