应用说明
通过原位4D STEM监测随机取向的结晶过程
November 1, 2024
Tin
Element density: 7.31 g/cm3
Electron configuration: [Kr]4d105s25p2
Oxidation states: +2,4
X-ray peak intensities
A quick-reference for exploring x-ray peak intensities across element series (K, L, M, N) to support accurate EDS analysis in electron microscopy.
| K-Series | L-Series | M-Series | N-Series | ||||
|---|---|---|---|---|---|---|---|
| Kα | 25.268 | Ll | 3.043 | Mz | 0.398 | ||
| Kβ | 28.554 | Ln | 3.271 | Mγ | 0.691 | ||
| Lα1 | 3.442 | ||||||
| Lβ1 | 3.661 | ||||||
| Lβ2 | 3.903 | ||||||
| Lγ1 | 4.129 | ||||||
| Lγ2 | 4.375 | ||||||
Applications
Unlock the power of electron microscopy with Gatan—explore cutting-edge applications, dive into expert-led webinars, and discover insights through detailed application notes that fuel scientific breakthroughs.
应用说明
Mapping the electronic band gap of semiconductor compounds with milli-electron volt accuracy
December 1, 2023
应用说明
为成功的EBSD分析而进行的多相铝合金表面优化处理
May 1, 2023
应用说明
Cathodoluminescence as a technique for inspection, metrology, and failure analysis of microLED processing
November 12, 2020
Media Gallery
Immerse yourself in the world of scientific discovery—explore striking microscopy images that reveal the unseen, alongside videos and tutorials showcasing Gatan technology in action.
