网络研讨会
Off the grid: Advanced scanning strategies for modern STEM
March 12, 2026
Lead
Element density: 11.34 g/cm3
Electron configuration: [Xe]4f145d106s26p2
Oxidation states: +2,4
X-ray peak intensities
A quick-reference for exploring x-ray peak intensities across element series (K, L, M, N) to support accurate EDS analysis in electron microscopy.
| K-Series | L-Series | M-Series | N-Series | ||||
|---|---|---|---|---|---|---|---|
| Kα | 74.976 | Ll | 9.182 | Mz | 1.839 | N | 0.284 |
| Kβ | 85.051 | Ln | 11.345 | Mα | 2.342 | ||
| Lα1 | 10.548 | Mβ | 2.442 | ||||
| Lβ1 | 12.610 | Mγ | 2.652 | ||||
| Lβ2 | 12.617 | M2N4 | 3.124 | ||||
| Lγ1 | 14.756 | ||||||
| Lγ2 | 15.094 | ||||||
Applications
Unlock the power of electron microscopy with Gatan—explore cutting-edge applications, dive into expert-led webinars, and discover insights through detailed application notes that fuel scientific breakthroughs.
应用说明
利用 STEMx 系统和您现有的 Gatan 原位相机进行纳米束应变分析
March 1, 2025
应用说明
混合卤化物钙钛矿的成分和晶体取向的 SEM 表征
May 8, 2024
应用说明
Use of a large area windowless EDS detector for quantitative analysis of heavy elements at high accelerating voltages
April 2, 2024
应用说明
GIF Continuum 实现纳米电子材料的高速组分和化学分析
January 1, 2024
Media Gallery
Immerse yourself in the world of scientific discovery—explore striking microscopy images that reveal the unseen, alongside videos and tutorials showcasing Gatan technology in action.
