Metro 原位电子计数相机

型号 1130, 1133

为突破性成像、衍射和原位研究而生的先进电子计数相机。

优点

Metro^® – 系列，用于突破性成像、衍射和原位研究的先进电子计数相机。通过电子计数，现在可以对剂量敏感的样品进行成像并进行低剂量研究。这不仅可以提升结果，还可以将您在2D材料、电池、催化剂、纳米管、聚合物和有机/生物材料的研究推向新的边界。

使用您的现有电镜，实现更低剂量率和更微弱信号的检测：

60 – 200 kV（Metro，型号 1130）
120 – 300 kV（Metro 300，型号 1133）

Images the most beam-sensitive specimens

电子束敏感样品的成像

Captures fine details, even at the lowest dose rates

在极限剂量率下捕捉样品细节

enhanced visibility of patterns/features

获得几乎没有背底噪音的高质量衍射花样

Stores in-situ, 2k video at ≤41 fps (Metro) and ≤50 fps (Metro 300)

原位存储 ≤41 fps（Metro）和 ≤50 fps（Metro 300）的 2k 视频

使用您熟悉的源自 OneView^® IS 相机简单而又强大的 DigitalMicrograph^®软件界面采集图像

With one click, corrects for drift with automatic sub-frame alignment during image capture

一次点击，即可自动子图像帧对齐来校正漂移

产品说明书

Metro 原位电子计数相机

应用

借由 Gatan 解锁电子显微技术的强大潜力——探索前沿应用，深入参与专家主导的网络研讨会，并通过详尽的应用指南汲取专业洞见，赋能科研创新。

揭示电镜深度见解

Atomic resolution imaging of hexagonal water ice

应用说明

六方冰的原子分辨成像

January 1, 2026

Imaging 2D materials at low kV with Metro

应用说明

使用Metro 相机在低电压下进行 2D 材料成像

August 1, 2024

Acquiring counted 4D STEM with the Metro camera

应用说明

利用 Metro 相机采集电子计数的 4D STEM

August 1, 2024

应用说明

Imaging extremely beam-sensitive materials with Metro

August 1, 2024

Monitoring and quantification of beam damage via low-dose continuous imaging

应用说明

通过低剂量连续成像监测和量化电子束损伤

July 1, 2024

揭示电镜深度见解

媒体库

沉浸于科学发现的世界——探索揭示微观奥秘的震撼显微图像，同时观看展示 Gatan 技术实际应用的视频与教程。

发现细节

Low dose imaging of a beam-sensitive Zeolite sample

Detail is observed out to the Nyquist frequency of the camera, even at a dose rate of 0.74 e-/Å2/s and a total dose of just 25 e-/Å2, allowing a large field of view to be imaged. This is made possible by electron counting.

Metro camera for MicroED/3DED A three-dimensional electron diffraction dataset was collected with the Metro camera from a PPEA crystalline sample (courtesy of Dr. Tatiana Gorelik).

Metro 2k image of the same field of view as a OneView image, showing that the lattice fringes are still clearly resolved, due to the high DQE and minimal blurring of the Metro.

Metro captures 4D STEM data with sharper detail and less background noise; it can collect a 128 x 128 (scan) x 512 x 512 (pattern) dataset in half a minute. This color image is a map of the brightest spot orientation and intensity from such a dataset. The material is boron nitride. The color hue in the map specifies the direction from center of the strongest spot in each diffraction pattern, while the brightness corresponds to the intensity of the peak.