ClearView 相机

型号 1195

提升您日常电子显微表征工作的高性能闪烁体相机

优点

向您介绍 ClearView^®，提升您日常透射电子显微（TEM）表征工作的高性能闪烁体相机。借助 ClearView，所有人都能以 Gatan 最快的闪烁体相机帧率采集具有影响力的原位和 4D STEM 数据。新的相机成像模式令您更容易从材料科学和生命科学样品中捕捉到高质量的图像。

捕捉高质量图像

新的 CMOS 传感器具备总是开启的高动态范围传感器读出，并以 50 帧每秒（fps）的速率采集 4k x 4k 图像和视频

Record in-situ video and 4D STEM data at the highest speeds of any scintillator camera: Acquire data up to 1,600 fps at 256 x 256 resolution to record fast in-situ reactions or analyze large areas quickly with 4D STEM

在 Gatan 所有闪烁体相机中以最快的速度记录原位和 4D STEM 数据

最高可在 256 x 256 分辨率下以 1600 fps 记录高速原位反应或通过 4D STEM 快速分析大面积样品

$Maximize signal-to-noise for low-contrast imaging and diffraction: New enhanced frame exposure imaging mode integrates less read noise to better resolve subtle image and diffraction features under low-dose conditions$

为低衬度成像和衍射带来更高的信噪比

全新增强的单帧曝光时间成像模式累积更少读出噪声，更好的分辨低剂量条件下细微的成像和衍射特征

为各种技术或实验实现所需的帧率和数据率

通过新的传感器子区域读出选项控制图像尺寸和视野大小

Integrates with eaSI technology for the most efficient multidimensional and multimodal experiments: Acquires 4D STEM data linked with elemental data from complimentary detectors

一体化至 eaSI 技术中，带来高效的多维度多模态实验

采集 4D STEM 数据并从兼容的探测器采集关联的元素数据

In-situ option

Image binning increases framerate by 4x, and sensor sub-area readouts increase framerate by up to 8x
Combine binning with sub-area readout to reach up to 1,600 fps and study sub-ms in-situ reactions
Never miss the start of a reaction with LookBack™, a post-event triggered video buffer to ensure events are captured from the start
Confidently record long experiments with TimeLapse, which saves data at a longer interval of time or number of frames
Process data from start to finish in DigitalMicrograph^® using tools for drift correction, video editing, and data exporting

Low distortion option

Guarantees high-resolution, low-distortion images for quantitative spatial measurements on your TEM
Improved fiber-optic coupling and imaging performance minimize camera distortions
Low camera distortion offers a greater margin to achieve total distortion specification for regular TEM qualification

Datasheet

ClearView 相机ClearView Service Plans

应用

借由 Gatan 解锁电子显微技术的强大潜力——探索前沿应用，深入参与专家主导的网络研讨会，并通过详尽的应用指南汲取专业洞见，赋能科研创新。

揭示电镜深度见解

$Frame Control mode for optimized imaging and diffraction with ClearView camera$

ClearView 相机的帧率可控模式：优化成像与衍射的信噪比

揭示电镜深度见解

媒体库

沉浸于科学发现的世界——探索揭示微观奥秘的震撼显微图像，同时观看展示 Gatan 技术实际应用的视频与教程。

发现细节

4D STEM and virtual aperture imaging with ClearView

The ClearView camera can acquire 4D STEM datasets at up to 1,600 fps, enabling high-throughput and large area 4D STEM acquisition. Using built-in tools in DigitalMicrograph, users can probe the diffraction image at different locations within the 4D STEM spectrum image and reconstruct RGB images from different virtual dark-field images. Images acquired at 200 kV using the ClearView camera and STEMx system (eaSI).

$Selected area electron diffraction pattern$

Selected area electron diffraction of Au nanoparticles taken with ClearView camera (4k x 4k, 2 s acquisition, 50 fps) and Spectra 300 at 300 kV.

$Better resolve faint, high-resolution diffraction spots$

Enabling Frame Control mode allows users to better leverage the full dynamic range of the camera and maximize the signal-to-noise in acquired images by reducing the camera framerate and minimizing the total readout noise in an image. The left image shows a selected area electron diffraction pattern of a Si [110] sample. Frame Control mode was used to optimize the signal-to-noise. The diffraction pattern was a 1s acquisition at 4 fps and 4k x 4k resolution. The middle image shows an inset area of the diffraction pattern, showing faint diffraction spots. Spot #1 in particular is very faint.

HRTEM Imaging of MgCrMnO4 material for lithium-ion batteries. Image captured with ClearView camera at 4k x 4k resolution and at 200 kV. Data courtesy of Danial Zangeneh, University of Illinois Chicago (UIC)

Enabling Frame Control mode allows users to better leverage the full dynamic range of the camera and maximize the signal-to-noise in acquired images by reducing the camera framerate and minimizing the total readout noise in an image. The left and middle images show a 2 s image acquisition captured at 4k x 4k resolution and 50 fps. These images provide high levels of detail from the semiconductor sample being imaged. The right image utilizes Frame Control mode to capture a 2 s image at 4k x 4k resolution and 1 fps and shows the same inset area.

Image samples at the desired orientation with TruAlign

TruAlign enables a digital rotation of the ClearView camera image so that data can be acquired at the desired sample orientation. Images acquired with a ClearView camera at 200 kV and . The original sample orientation image was acquired at 4k x 4k resolution and the TruAlign image was acquired at 2850 x 2850 resolution.

Large field of view, high resolution imaging of Au particles

Au nanoparticles, with fast Fourier transform (FFT) showing 0.9 Å resolution information (dashed line). Captured with ClearView camera (4k x 4k, 5 s acquisition, 15 fps) and Spectra 300 at 300 kV.

Live drift correction during imaging acquisition

ClearView can acquire images up to 30 s total capture time and apply a live drift correction to remove the effects of spatial drift. Utilizing live drift correction enables high-resolution data acquisition even with sample drift. Images acquired with a ClearView camera at 4k x 4k resolution and 200 kV.