应用说明
利用 Metro 相机采集电子计数的 4D STEM
August 1, 2024
Boron
Element density: 2.46 g/cm3
Electron configuration: [He]2s22p1
Oxidation states: +3
X-ray peak intensities
A quick-reference for exploring x-ray peak intensities across element series (K, L, M, N) to support accurate EDS analysis in electron microscopy.
| K‑Series | L‑Series | M‑Series | N‑Series | ||||
|---|---|---|---|---|---|---|---|
| Kα | 0.183 | ||||||
Applications
Unlock the power of electron microscopy with Gatan—explore cutting-edge applications, dive into expert-led webinars, and discover insights through detailed application notes that fuel scientific breakthroughs.
应用说明
Spectroscopic analysis of ultra-wide bandgap semiconductors
July 1, 2024
应用说明
Electric field mapping in 2D heterostructures using differential phase contrast
May 1, 2024
应用说明
关于APEX EDS软件中轻元素和重元素的无标样EDS分析的准确性
March 30, 2022
Media Gallery
Immerse yourself in the world of scientific discovery—explore striking microscopy images that reveal the unseen, alongside videos and tutorials showcasing Gatan’s technology in action.
