EDAX Insight Vol. 21 No. 3

Articles include:

• EDAX OIM Analysis 9 – The best just got better
• Combining NPAR with spherical indexing – A unique method to solve the most challenging EBSD indexing problems
• The effect of pattern size and sensitivity to noise refinement in EBSD patterns
• EDAX and Gatan merge to offer the ultimate suite of microscopy tools