K3 相机

型号 1025, 1024

K3 是直接探测相机性能表现的新标杆

优点

K3^® 是直接探测相机性能表现的新标杆，从头开始重新设计，这款真正的新一代相机面向生命科学和材料科学研究领域极具挑战的低剂量电子显微术应用进行了优化。 K3 相机是Gatan 在实时、单电子计数直接探测相机技术领域深厚经验的完整与全新表达。

Powerful inline signal processing will raise the DQE beyond that of the K2® camera; the addition of CDS mode pushes this even higher

强大的在线信号处理功能，带来超越 K2^® 相机的 DQE 表现; CDS 模式的加入进一步提高相机的DQE

Real-time electron counting immediately lets you know if your samples are good

实时电子计数使您可以即时判断样品质量

Optional inline, GPU-based motion correction avoids the need to save terabytes of raw frames

可选配基于 GPU 的在线运动修正模块，避免储存体量高达 TB 级的原始图像帧数据

up to 1500 full frames per second capture

每秒 1500 帧全幅读出 – K2 相机的 3.75 倍

Match the field of view with your application needs

匹配您应用需要的视野大小

产品说明书

K3 相机

应用

借由 Gatan 解锁电子显微技术的强大潜力——探索前沿应用，深入参与专家主导的网络研讨会，并通过详尽的应用指南汲取专业洞见，赋能科研创新。

揭示电镜深度见解

$Acquiring counted electron diffraction data without a beam stop with Gatan electron counting direct detectors$

Acquiring counted electron diffraction data without a beam stop with Gatan electron counting direct detectors

揭示电镜深度见解

媒体库

沉浸于科学发现的世界——探索揭示微观奥秘的震撼显微图像，同时观看展示 Gatan 技术实际应用的视频与教程。

发现细节

Electron-counted SAED of ZSM-5 with the K3 camera (left) Selected area diffraction pattern of ZSM-5 was acquired with a 1.3 s exposure without a beam stop. (right) Profile of the diffraction spots showing high SNR for peak intensities varying over three orders of magnitude. Sample courtesy of Dr. Dos Reis, Northwestern University.

K3 camera for MicroED/3DED Counted three-dimensional electron diffraction dataset from a ZSM-5 crystal collected with the K3® camera. Diffraction patterns were recorded at 0.5° intervals collected over 10°. The cumulative dose was ∼0.5 e-/Å2.